A CMOS image sensor with a buried-channel source follower

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 51, Issue , 2008, Pages 62-64

  Wang, Xinyang ^a   Snoeij, Martijn F ^a,b   Rao, Padmakumar R ^a   Mierop, Adri ^c   Theuwissen, Albert J P ^a,d  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Texas Instruments Deutschland GmbH   (Germany)

^c DALSA Semiconductors   (Netherlands)

^d Harvest Imaging   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS;

BURIED CHANNELS; CMOS IMAGE SENSOR; MINIMIZING THE NUMBER OF; OUTPUT SWING; PINNED PHOTODIODES; RANDOM NOISE; SOURCE FOLLOWERS; SURFACE CHANNEL;

PIXELS;

EID: 49649114175     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2008.4523057     Document Type: Conference Paper

References (5)

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2. Assaf Lahav, D. Veinger and A. Fenigstein, "Optimization of Random Telegraph Noise Non Uniformity in a CMOS Pixel with a Pinned-Photodiode," Int'l Image Sensor Workshop, pp. 230-234, June 2007.
3. K. Findlater, R. Henderson, D. Baxter et al., "SXGA Pinned Photodiode CMOS Image Sensor in 0.35μm Technology," ISSCC Dig. Tech. Papers, pp. 218-219, 2003.
4. Xinyang Wang, P. R. Rao, A. Mierop et al., "Random Telegraph Signal in CMOS Image Sensor Pixels," IEDM Tech. Dig, pp.115-118, 2006.
5. B. Pain, T Cunningham, B. Hancock et al., "Excess Noise and Dark Current Mechanisms in CMOS Imagers," IEEE Workshop on CCD and Advanced Image Sensor, pp.145-148, June 2005.