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Volumn 326, Issue 1, 2011, Pages
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Influence of annealing temperature on the structural, optical and electrical properties of amorphous Zinc Sulfide thin films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ANNEALING;
ATMOSPHERIC TEMPERATURE;
ELECTROMAGNETIC WAVE ABSORPTION;
ENERGY GAP;
LIGHT ABSORPTION;
REFRACTIVE INDEX;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION;
ZINC;
ZINC SULFIDE;
ANNEALING TEMPERATURES;
CHEMICAL BATH DEPOSITION TECHNIQUE;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL MEASUREMENT;
EXTINCTION COEFFICIENT (K);
OPTICAL AND ELECTRICAL PROPERTIES;
THERMAL ANNEALING TREATMENT;
ZINC SULFIDE THIN FILMS;
AMORPHOUS FILMS;
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EID: 82955171636
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/326/1/012020 Document Type: Conference Paper |
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Times cited : (15)
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References (18)
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