When beauty is only skin deep; Optimizing the sensitivity of specular neutron reflectivity for probing structure beneath the surface of thin films

Journal of Applied Physics

Volumn 110, Issue 10, 2011, Pages

  Majkrzak, Charles F ^a   Carpenter, Elisabeth ^a,b   Heinrich, Frank ^a,c   Berk, Norman F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b POLYTECHNIC UNIVERSITY   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARD CONDENSED MATTER; INTERACTION-FREE MEASUREMENT; KEY FACTORS; MULTI-LAYERED; NANOMETER SCALE STRUCTURE; NEUTRON REFLECTOMETRY; ORGANIC CHEMISTRY; PHASE INFORMATION; POLYMER SCIENCE; QUANTUM PHENOMENA; SOFT CONDENSED MATTERS; SPECULAR NEUTRON REFLECTIVITIES; STATISTICAL EFFICIENCY; TRANSMISSION DATA;

NEUTRON REFLECTION; POLYMER FILMS; PROBES; REFLECTION; SOLIDS; THIN FILMS;

SURFACE STRUCTURE;

EID: 82555180448     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3661979     Document Type: Conference Paper

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