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Volumn , Issue , 2008, Pages

Reliability modeling for dependent competitive failure processes

Author keywords

Degradation process; Dependent competitive failure; Multi state reliability theory; Shock process

Indexed keywords

DEGRADATION PROCESS; DEPENDENT COMPETITIVE FAILURE; FAILURE PROCESS; FIXED PERIOD; MECHANICAL SYSTEMS; MULTI-STATE RELIABILITY THEORY; NEW SYSTEM; NUMERICAL EXAMPLE; POISSON PROCESS; PRACTICAL ENGINEERING APPLICATIONS; RANDOM ENVIRONMENT; REGULAR PERIODS; RELIABILITY MODELING; ROTATING DEVICE; SHOCK PROCESS; SYSTEM FAILURES;

EID: 67650286800     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2008.4925808     Document Type: Conference Paper
Times cited : (21)

References (9)
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  • 4
    • 33846217033 scopus 로고    scopus 로고
    • Degradation Models and Implied Lifetime Distributions
    • S. J. Bae, W. Kuo, P. H. Kvam, "Degradation Models and Implied Lifetime Distributions", Reliability Eng. & System Safety, Vol. 92, 2007, pp 601-608.
    • (2007) Reliability Eng. & System Safety , vol.92 , pp. 601-608
    • Bae, S.J.1    Kuo, W.2    Kvam, P.H.3
  • 5
    • 22444443657 scopus 로고    scopus 로고
    • An Alternative Degradation Reliability Modeling Approach Using Maximum Likelihood Estimation
    • W. Huang, D. L. Dietrich, "An Alternative Degradation Reliability Modeling Approach Using Maximum Likelihood Estimation", IEEE Tran. on Reliability, Vol. 54, 2005, pp 310-317.
    • (2005) IEEE Tran. on Reliability , vol.54 , pp. 310-317
    • Huang, W.1    Dietrich, D.L.2
  • 7
    • 34047261816 scopus 로고    scopus 로고
    • Generalized Shock Models Based on a Cluster Point Process
    • J. M. Bai, Z. H. Li, X. B. Kong, "Generalized Shock Models Based on a Cluster Point Process", IEEE Tran. On Reliability, Vol. 55, 2006, pp 542-550.
    • (2006) IEEE Tran. On Reliability , vol.55 , pp. 542-550
    • Bai, J.M.1    Li, Z.H.2    Kong, X.B.3
  • 8
    • 22444446708 scopus 로고    scopus 로고
    • Reliability Modeling of Multi-State Degraded Systems with Multi-Competing Failures and Random Shocks
    • W. J. Li, H. Pham, "Reliability Modeling of Multi-State Degraded Systems with Multi-Competing Failures and Random Shocks", IEEE Tran. On Reliability, Vol. 54, 2005, pp 297-303.
    • (2005) IEEE Tran. On Reliability , vol.54 , pp. 297-303
    • Li, W.J.1    Pham, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.