A comparison of the strength of autohesion of plasma treated amorphous and semi-crystalline PEEK films

Polymers for Advanced Technologies

Volumn 22, Issue 12, 2011, Pages 2496-2502

  Zhang, Shengnan ^a   Awaja, Firas ^a   James, Natalie ^b   McKenzie, David R ^a   Ruys, Andrew J ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b Research and Technology Labs   (Australia)

Author keywords

Autohesion; Polyether ether ketone (PEEK); XPS

Indexed keywords

AMBIENT OXIDATION; AMORPHOUS SAMPLES; AUTOHESION; BOND FORMATION; ELECTRONIC COMPONENT; JOINING TECHNOLOGY; MEDICAL IMPLANTS; NITROGEN CONCENTRATIONS; OXYGEN CONCENTRATIONS; OXYGEN GROUPS; PLASMA TREATMENT; PROFILOMETERS; RF PLASMA; SEMICRYSTALLINES; SURFACE ACTIVATION; WATER CONTACT ANGLE;

BOND STRENGTH (MATERIALS); CHEMICAL BONDS; CONTACT ANGLE; CRYSTALLINE MATERIALS; ETHERS; FUNCTIONAL GROUPS; JOINING; KETONES; OXYGEN; PLASMA APPLICATIONS; PLASMAS; SURFACE CHEMISTRY; SURFACE ROUGHNESS; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS FILMS;

EID: 82155184433     PISSN: 10427147     EISSN: 10991581     Source Type: Journal    
DOI: 10.1002/pat.1791     Document Type: Article

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