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Volumn 89, Issue 1, 2012, Pages 100-103
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Fabrication and optical characterization of full color stop band based on rugate-structured porous silicon
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Author keywords
Full color stop band; Photonic structure; Porous silicon; Reflectivity; Rugate
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Indexed keywords
ETCHING TIME;
FREQUENCY CHANGES;
FULL COLOR;
LINEAR DEPENDENCE;
OPTICAL CHARACTERIZATION;
PHOTONIC STRUCTURE;
REFLECTION BANDS;
RUGATE;
SHORTER WAVELENGTH;
STOP-BANDS;
ETCHING;
REFLECTION;
POROUS SILICON;
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EID: 81855182170
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2011.03.143 Document Type: Conference Paper |
Times cited : (6)
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References (15)
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