Vapor sensors based on optical interferometry from oxidized microporous silicon films

Langmuir

Volumn 18, Issue 6, 2002, Pages 2229-2233

  Gao, Jun ^a   Gao, Ting ^a   Yang Li, Yang ^a   Sailor, Michael J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

VAPOR SENSORS;

INTERFEROMETRY; MICROPOROUS MATERIALS; OPTICAL FILMS; OXIDATION; POROSITY; POROUS SILICON; REFRACTIVE INDEX; TRANSCONDUCTANCE; VAPORS;

OPTICAL SENSORS;

EID: 0037133875     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la015568f     Document Type: Article

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