Variability in sepiolite: Diffraction studies

American Mineralogist

Volumn 96, Issue 10, 2011, Pages 1443-1454

  Del Río, Manuel Sánchez ^a   García Romero, Emilia ^b,e   Suárez, Mercedes ^c   Da Silva, Iván ^a   Fuentes Montero, Luis ^d   Martínez Criado, Gema ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^c UNIVERSITY OF SALAMANCA   (Spain)

^d INSTITUT LAUE LANGEVIN   (France)

^e INSTITUTO DE GEOCIENCIAS   (Spain)

Author keywords

2D diffraction pattern; Ab initio simulations; Rietveld; SAED; SEM; Sepiolite; TEM; X ray diffraction

Indexed keywords

CLAY MINERALS; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; INTERFEROMETRY; MORPHOLOGY; RIETVELD METHOD; RIETVELD REFINEMENT; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

AB INITIO SIMULATIONS; HIGH QUALITY SINGLE CRYSTALS; SAED; SEPIOLITE; SINGLE-CRYSTAL DIFFRACTION; STRUCTURAL PARAMETER; X RAY FIBER DIFFRACTION; X RAY MICRODIFFRACTION;

X RAY CRYSTALLOGRAPHY;

CHEMICAL COMPOSITION; COMPUTER SIMULATION; CRYSTALLOGRAPHY; DIFFRACTION; NUMERICAL MODEL; PALYGORSKITE; RIETVELD ANALYSIS; SCANNING ELECTRON MICROSCOPY; SEPIOLITE;

EID: 81455142080     PISSN: 0003004X     EISSN: 19453027     Source Type: Journal    
DOI: 10.2138/am.2011.3761     Document Type: Article

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