XRD profile analysis of clay minerals

Materials Science Forum

Volumn 278-281, Issue PART 1, 1998, Pages 139-144

  Janeba, D ^a   Capkova P ^a   Weiss, Z ^b   Schenk, H ^c  

^a CHARLES UNIVERSITY   (Czech Republic)

^b VSB TECHNICAL UNIVERSITY OF OSTRAVA   (Czech Republic)

^c UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Intercalates; Layered Structures; XRD Profile Analysis

Indexed keywords

ALUMINUM COMPOUNDS; CLAY MINERALS; SURFACE ROUGHNESS; ELECTROMAGNETIC WAVE POLARIZATION; X RAY DIFFRACTION ANALYSIS;

DIFFRACTION LINES; INTERCALATES; INTERFERENCE FUNCTIONS; LAYERED STRUCTURES; PROFILE ANALYSIS; PROFILE DISTORTION; STRUCTURAL FACTOR; STRUCTURAL MODELING;

X RAY DIFFRACTION; CLAY MINERALS;

LORENTZ POLARIZATION;

EID: 11644295152     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.278-281.139     Document Type: Article

References (6)

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