Magneto- and electro-resistance effects in phase separated Pr 0.55(Ca0.65S0.35)0.45MnO 3 films

Journal of Applied Physics

Volumn 110, Issue 9, 2011, Pages

  Kumar, Ashvani ^a   Dho, Joonghoe ^a  

^a Kyungpook National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; AS-DEPOSITED FILMS; DC CURRENT; ELECTRORESISTANCE; FERROMAGNETIC PROPERTIES; IN-PHASE; LATTICE STRAIN; MAGNETIC BEHAVIOR; METAL INSULATORS; POST ANNEALING; PULSE LASER DEPOSITION; STRUCTURAL CHANGE; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; X-RAY DIFFRACTION DATA;

ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; EPITAXIAL FILMS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MAGNETOELECTRONICS; MAGNETORESISTANCE; MANGANESE OXIDE; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; TANTALUM; X RAY DIFFRACTION;

ANNEALING;

EID: 81355132338     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3656456     Document Type: Article

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