Structure solution with automated electron diffraction tomography data: Different instrumental approaches

Journal of Microscopy

Volumn 244, Issue 3, 2011, Pages 325-331

  Gorelik, T E ^a   Stewart, A A ^a   Kolb, U ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Automated diffraction tomography; Electron diffraction; Structure solution

Indexed keywords

AUTOMATION; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; ELECTRONS; SODIUM COMPOUNDS; TOMOGRAPHY; TUNGSTEN COMPOUNDS;

AUTOMATED DIFFRACTION TOMOGRAPHY; DATA SET; DIFFRACTION TOMOGRAPHY; ELECTRON-BEAM; INSTRUMENTAL APPROACH; INTENSITY DATA; NANO-CRYSTALLINE MATERIALS; NON-ORIENTED; RECIPROCAL SPACE; STRUCTURE SOLUTIONS;

ELECTRON BEAMS;

ARTICLE; AUTOMATION; ELECTRON BEAM TOMOGRAPHY; LIGHT; PRIORITY JOURNAL;

EID: 81255158691     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2011.03550.x     Document Type: Article

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