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Volumn 60, Issue 12, 2011, Pages 3907-3912

Design considerations for a CCC bridge with complete digital control

Author keywords

Cryogenic current comparator (CCC); digital feedback loops; digital measurement; noise measurement; resistance measurement

Indexed keywords

CRYOGENIC CURRENT COMPARATOR; DIGITAL FEEDBACK LOOP; DIGITAL MEASUREMENT; NOISE MEASUREMENTS; RESISTANCE MEASUREMENT;

EID: 81255152005     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2011.2149330     Document Type: Article
Times cited : (7)

References (12)
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  • 5
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    • Automated CCC bridge for precision resistance measurements
    • Torino, Italy, Jul. 9-14
    • G. Rietveld, J. M. Williams, E. Houtzager, and T. J. B. M. Janssen, "Automated CCC bridge for precision resistance measurements," in Proc. CPEM Dig., Torino, Italy, Jul. 9-14, 2006, pp. 496-497.
    • (2006) Proc. CPEM Dig. , pp. 496-497
    • Rietveld, G.1    Williams, J.M.2    Houtzager, E.3    Janssen, T.J.B.M.4
  • 7
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    • CCC bridge with digitally controlled current sources
    • Apr
    • C. A. Sanchez, B. M. Wood, and A. D. Inglis, "CCC bridge with digitally controlled current sources," IEEE Trans. Instrum. Meas., vol. 58, no. 4, pp. 1202-1205, Apr. 2009.
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  • 8
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    • Design considerations for a CCC bridge with complete digital control
    • Daejeon, Korea, Jun. 13-18
    • J. M. Williams, G. Rietveld, E. Houtzager, and T. J. B. M. Janssen, "Design considerations for a CCC bridge with complete digital control," in Proc. CPEM Dig., Daejeon, Korea, Jun. 13-18, 2010, pp. 625-626.
    • (2010) Proc. CPEM Dig. , pp. 625-626
    • Williams, J.M.1    Rietveld, G.2    Houtzager, E.3    Janssen, T.J.B.M.4
  • 9
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    • An automated cryogenic current comparator resistance ratio bridge for routine resistance measurements
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    • J. M. Williams, T. J. B. M. Janssen, G. Rietveld, and E. Houtzager, "An automated cryogenic current comparator resistance ratio bridge for routine resistance measurements," Metrologia, vol. 47, no. 3, pp. 167-174, Jun. 2010.
    • (2010) Metrologia , vol.47 , Issue.3 , pp. 167-174
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  • 10
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    • Design and metrological applications of a low noise, high electrical isolation measurement unit
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    • J. M. Williams, D. R. Smith, D. Georgakopoulos, P. D. Patel, and J. R. Pickering, "Design and metrological applications of a low noise, high electrical isolation measurement unit," IET Sci. Meas. Technol., vol. 3, no. 2, pp. 165-174, Mar. 2009.
    • (2009) IET Sci. Meas. Technol. , vol.3 , Issue.2 , pp. 165-174
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.