메뉴 건너뛰기




Volumn 3, Issue 2, 2009, Pages 165-174

Design and metrological applications of a low noise, high electrical isolation measurement unit

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS; ELECTRIC POWER SYSTEMS; FATIGUE TESTING; FIRMWARE; FORCE MEASUREMENT; STANDARDS; UNITS OF MEASUREMENT;

EID: 61349161145     PISSN: 17518822     EISSN: None     Source Type: Journal    
DOI: 10.1049/iet-smt:20080112     Document Type: Article
Times cited : (14)

References (14)
  • 1
    • 0346806094 scopus 로고
    • Quantum standards for electrical units
    • 10.1080/00107518808222603 0010-7514
    • Hartland, A.: ' Quantum standards for electrical units ', Contemp. Phys., 1988, 29, p. 477 10.1080/00107518808222603 0010-7514
    • (1988) Contemp. Phys. , vol.29 , pp. 477
    • Hartland, A.1
  • 2
    • 0002205732 scopus 로고
    • New international electrical reference standards based on the Josephson and quantum Hall effects
    • 10.1088/0026-1394/26/1/004
    • Taylor, B.N., and Witt, T.J.: ' New international electrical reference standards based on the Josephson and quantum Hall effects ', Metrologia, 1989, 26, (1), p. 47-62 10.1088/0026-1394/26/1/004
    • (1989) Metrologia , vol.26 , Issue.1 , pp. 47-62
    • Taylor, B.N.1    Witt, T.J.2
  • 3
    • 0026238882 scopus 로고
    • An optical-fibre ring interface bus for precise electrical measurements
    • 10.1088/0957-0233/2/10/011 0957-0233
    • Robinson, I.A.: ' An optical-fibre ring interface bus for precise electrical measurements ', Meas. Sci. Technol., 1991, 2, (10), p. 949-956 10.1088/0957-0233/2/10/011 0957-0233
    • (1991) Meas. Sci. Technol. , vol.2 , Issue.10 , pp. 949-956
    • Robinson, I.A.1
  • 4
    • 61349135371 scopus 로고    scopus 로고
    • Guidance on eliminating interference from sensitive electrical circuits ', NPL Report DES 129, available online from NPL
    • ' Guidance on eliminating interference from sensitive electrical circuits ', NPL Report DES 129, available online from NPL
  • 5
    • 0026142690 scopus 로고
    • An automated cryogenic current comparator resistance ratio bridge
    • 0018-9456
    • Williams, J.M., and Hartland, A.: ' An automated cryogenic current comparator resistance ratio bridge ', IEEE Trans. Instrum. Meas., 1991, 40, (2), p. 267-270 0018-9456
    • (1991) IEEE Trans. Instrum. Meas. , vol.40 , Issue.2 , pp. 267-270
    • Williams, J.M.1    Hartland, A.2
  • 6
    • 0036875677 scopus 로고    scopus 로고
    • Cryogenic current comparator bridge for quantum Hall resistance ratio measurements
    • 10.1049/ip-smt:20020758
    • Kleinschmidt, P., Williams, J.M., Fletcher, N.E., and Janssen, T.J.B.M.: ' Cryogenic current comparator bridge for quantum Hall resistance ratio measurements ', IEE Proc.-Sci. Meas. Technol., 2002, 149, (6), p. 302-304 10.1049/ip-smt:20020758
    • (2002) IEE Proc.-Sci. Meas. Technol. , vol.149 , Issue.6 , pp. 302-304
    • Kleinschmidt, P.1    Williams, J.M.2    Fletcher, N.E.3    Janssen, T.J.B.M.4
  • 10
    • 0000779694 scopus 로고
    • Synthesis of constant-time-delay ladder networks using Bessel polynomials
    • Storch, L.: ' Synthesis of constant-time-delay ladder networks using Bessel polynomials ', Proc. IRE, 1954, 42, 11, p. 1666-1675 ()
    • (1954) Proc. IRE , vol.42 , Issue.11 , pp. 1666-1675
    • Storch, L.1
  • 11
    • 0025503164 scopus 로고
    • The NPL Josephson junction array system and its use for voltage ratio measurements
    • 10.1088/0957-0233/1/10/001 0957-0233
    • Henderson, L.C.A., and Jones, R.G.: ' The NPL Josephson junction array system and its use for voltage ratio measurements ', Meas. Sci. Technol., 1990, 1, p. 993-999 10.1088/0957-0233/1/10/001 0957-0233
    • (1990) Meas. Sci. Technol. , vol.1 , pp. 993-999
    • Henderson, L.C.A.1    Jones, R.G.2
  • 12
    • 21244460299 scopus 로고    scopus 로고
    • Application of the Josephson effect to voltage metrology
    • 10.1109/JPROC.2004.833671 0018-9219
    • Benz, S.P., and Hamilton, C.A.: ' Application of the Josephson effect to voltage metrology ', Proc. IEEE, 2004, 92, (10), p. 1617-1629 10.1109/JPROC.2004.833671 0018-9219
    • (2004) Proc. IEEE , vol.92 , Issue.10 , pp. 1617-1629
    • Benz, S.P.1    Hamilton, C.A.2
  • 13
    • 61349187594 scopus 로고    scopus 로고
    • BS 7935-2:2004 Constant amplitude dynamic force calibration-Part 2: calibration of device instrumentation to be used for the dynamic calibration of nonresonant uniaxial dynamic testing systems method
    • BS 7935-2:2004 Constant amplitude dynamic force calibration-Part 2: calibration of device instrumentation to be used for the dynamic calibration of nonresonant uniaxial dynamic testing systems method
  • 14
    • 33751323381 scopus 로고    scopus 로고
    • Dynamic characterisation of the electronic instrumentation used in the calibration of fatigue testing machines
    • 10.1049/ip-smt:20050104
    • Georgakopoulos, D., Williams, J.M., Knott, A., Esward, T.J., and Wright, P.S.: ' Dynamic characterisation of the electronic instrumentation used in the calibration of fatigue testing machines ', IEE Proc.-Sci. Meas. Technol., 2006, 153, (6), p. 256-259 10.1049/ip-smt:20050104
    • (2006) IEE Proc.-Sci. Meas. Technol. , vol.153 , Issue.6 , pp. 256-259
    • Georgakopoulos, D.1    Williams, J.M.2    Knott, A.3    Esward, T.J.4    Wright, P.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.