Identification of boron clusters in silicon crystal by B1s core-level X-ray photoelectron spectroscopy: A first-principles study

Applied Physics Letters

Volumn 99, Issue 19, 2011, Pages

  Yamauchi, Jun ^a   Yoshimoto, Yoshihide ^b   Suwa, Yuji ^c  

^a KEIO UNIVERSITY   (Japan)

^b TOTTORI UNIVERSITY   (Japan)

^c HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

B ATOMS; BORON CLUSTERS; COMPREHENSIVE STUDIES; CORE LEVELS; CRYSTALLINE SI; EXPERIMENTAL SPECTRA; FIRST-PRINCIPLES CALCULATION; FIRST-PRINCIPLES STUDY; MODEL SYSTEM; PLASMA DOPING; SILICON CRYSTAL; SUPER CELL;

ATOMIC SPECTROSCOPY; BINDING ENERGY; BORON; CALCULATIONS; PHOTONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 81155148711     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3658030     Document Type: Article

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