메뉴 건너뛰기




Volumn 46, Issue 1, 2007, Pages 14-20

Boron clusters in high-dose implanted silicon

Author keywords

Boron; Calculation; Cluster; Double acceptor; High dose implantation; Silicon; Structural transition; XPS

Indexed keywords

BORON COMPOUNDS; CHEMICAL SHIFT; ELECTRONIC STRUCTURE; MATHEMATICAL MODELS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34547871339     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.14     Document Type: Article
Times cited : (11)

References (29)
  • 28
    • 1542752682 scopus 로고
    • ed. F. H. Eisen et al, Gordon and Breach. Science, London
    • F. F. Morehead, Jr. and B. L. Crowder: in Ion Implantation, ed. F. H. Eisen et al. (Gordon and Breach. Science, London, 1971) p. 25.
    • (1971) Ion Implantation , pp. 25
    • Morehead Jr., F.F.1    Crowder, B.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.