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Volumn 46, Issue 1, 2007, Pages 14-20
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Boron clusters in high-dose implanted silicon
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Author keywords
Boron; Calculation; Cluster; Double acceptor; High dose implantation; Silicon; Structural transition; XPS
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Indexed keywords
BORON COMPOUNDS;
CHEMICAL SHIFT;
ELECTRONIC STRUCTURE;
MATHEMATICAL MODELS;
X RAY PHOTOELECTRON SPECTROSCOPY;
DOUBLE ACCEPTORS;
HIGH DOSE IMPLANTATION;
HOLE GENERATION;
STRUCTURAL TRANSITION;
SILICON COMPOUNDS;
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EID: 34547871339
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.46.14 Document Type: Article |
Times cited : (11)
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References (29)
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