Electrical characterization and Raman spectroscopy of individual vanadium pentoxide nanowire

Journal of Nanoparticle Research

Volumn 13, Issue 10, 2011, Pages 4929-4936

  Shen, W J ^a   Sun, K W ^a   Lee, C S ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Dielectrophoresis; Metal oxide; Nanowire; Phase transition

Indexed keywords

E-BEAM LITHOGRAPHY; ELECTRICAL CHARACTERIZATION; ELECTRICAL CONTACTS; ELECTRICAL RESISTANCES; FOUR-POINT; FOUR-POINT PROBE MEASUREMENTS; I - V CURVE; IV CHARACTERISTICS; METAL OXIDE; METALLIC CONTACTS; NANO-DEVICES; RAMAN MEASUREMENTS; ROOM TEMPERATURE; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; VANADIUM PENTOXIDE;

ACTIVATION ENERGY; ELECTRIC RESISTANCE; ELECTROPHORESIS; MEASUREMENTS; METALLIC COMPOUNDS; NANOWIRES; PHASE TRANSITIONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; VANADIUM; VANADIUM COMPOUNDS;

ELECTRIC WIRE;

NANOWIRE; VANADIUM PENTOXIDE;

ARTICLE; ELECTRIC RESISTANCE; NANOCHEMISTRY; NANODEVICE; PHASE TRANSITION; PRIORITY JOURNAL; RAMAN SPECTROMETRY;

EID: 80955165917     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-011-0471-3     Document Type: Article

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