Simple statistically based alternatives to MAF for ToF-SIMS spectral image analysis

Surface and Interface Analysis

Volumn 43, Issue 13, 2011, Pages 1616-1626

  Keenan, Michael R ^a   Smentkowski, Vincent S ^b  

^a General Electric Global Research Center ^*  (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

MAF; maximum autocorrelation factors; multivariate statistical analysis; noise; ToF SIMS

Indexed keywords

MAF; MAXIMUM AUTOCORRELATION FACTORS; MULTIVARIATE STATISTICAL ANALYSIS; NOISE; TOF SIMS;

AUTOCORRELATION; CORRELATION DETECTORS; IONS; MULTIVARIANT ANALYSIS; SECONDARY ION MASS SPECTROMETRY; STATISTICAL MECHANICS;

COVARIANCE MATRIX;

EID: 80955137633     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3757     Document Type: Article

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