3D profile measurement by color pattern projection and system calibration

Proceedings of the IEEE International Conference on Industrial Technology

Volumn 1, Issue , 2002, Pages 405-410

  Sinlapeecheewa, C ^a   Takamasu, K ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

3D profile measurement; Color pattern projection; Projector cameras calibration; Structured light

Indexed keywords

CALIBRATION; CAMERAS; COLOR; COLOR PRINTING; LIGHT SOURCES; ROBOTICS;

3-D PROFILE MEASUREMENTS; CALIBRATION METHOD; CAMERA-PROJECTOR CALIBRATIONS; COLOR PATTERN; PROJECTOR-CAMERA; STRUCTURED LIGHT; STRUCTURED LIGHTING; SYSTEM CALIBRATION;

COLOR MATCHING;

EID: 80855123488     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIT.2002.1189930     Document Type: Conference Paper

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