3-D shape measurement by self-referenced pattern projection method

Measurement: Journal of the International Measurement Confederation

Volumn 26, Issue 3, 1999, Pages 157-166

  Osawa, Sonko ^a   Furutani, Ryoshu ^a   Takamasu, Kiyoshi ^b   Ozono, Shigeo ^b   Asano, Hidemitsu ^c  

^a TOKYO DENKI UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c MITUTOYO CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COLOR IMAGE PROCESSING; OBJECT RECOGNITION; PROJECTION SYSTEMS; THREE DIMENSIONAL COMPUTER GRAPHICS;

SELF-REFERENCED PATTERN PROJECTION METHODS; THREE-DIMENSIONAL SHAPE MEASUREMENT;

PATTERN RECOGNITION SYSTEMS;

EID: 0033207433     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(99)00029-9     Document Type: Article

References (10)

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