Structural properties of the range-II-and range-III order in amorphous-SiO 2 probed by electron paramagnetic resonance and Raman spectroscopy

European Physical Journal B

Volumn 76, Issue 2, 2010, Pages 197-201

  Vaccaro, G ^a   Buscarino, G ^a   Agnello, S ^a   Messina, G ^b   Carpanese, M ^b   Gelardi, F M ^a  

^a UNIVERSITY OF PALERMO   (Italy)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PARAMAGNETIC RESONANCE; ELECTRON PARAMAGNETIC RESONANCE SPECTROSCOPY; EXPERIMENTAL INVESTIGATIONS; HYPERFINE STRUCTURE; TIME DURATION;

ELECTRON RESONANCE; ELECTRON SPIN RESONANCE SPECTROSCOPY; PARAMAGNETIC MATERIALS; POINT DEFECTS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICON COMPOUNDS;

PARAMAGNETIC RESONANCE;

EID: 80755165499     PISSN: 14346028     EISSN: 14346036     Source Type: Journal    
DOI: 10.1140/epjb/e2010-00189-y     Document Type: Article

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