Oblique incidence reflectometry and spectroscopic ellipsometry of split-ring resonators in infrared

Journal of Nanophotonics

Volumn 5, Issue 1, 2011, Pages

  Jakovljević, Milka ^a   Vasić, Borislav ^a   Isić, Goran ^a,b   Gajić, Radoš ^a   Oates, Tom ^c   Hinrichs, Karsten ^c   Bergmair, Iris ^d   Hingerl, Kurt ^e  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^d PROFACTOR GMBH   (Austria)

^e JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

ellipsometry; metamaterials; oblique incidence; optics

Indexed keywords

ELECTRIC FIELDS; ELLIPSOMETRY; MAGNETIC MOMENTS; MAGNETIC RESONANCE; METAMATERIALS; OPTICS; PLASMONICS; RING GAGES; SPECTROSCOPIC ELLIPSOMETRY;

ELLIPSOMETRIC SPECTRA; MAGNETIC AND ELECTRIC FIELDS; OBLIQUE INCIDENCE; OBLIQUE INCIDENCE REFLECTOMETRY; PLASMONIC MODES; REFLECTION SPECTRA; REFLECTION SPECTROSCOPY; SPLIT RING RESONATOR;

OPTICAL RESONATORS;

EID: 80655128196     PISSN: None     EISSN: 19342608     Source Type: Journal    
DOI: 10.1117/1.3601359     Document Type: Article

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