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Volumn 512, Issue 1, 2012, Pages 185-189
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Cu-doping effects on the physical properties of cadmium sulfide thin films
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Author keywords
Cadmium sulfide; Coatings; Resistivity; Thin films
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Indexed keywords
AS-DEPOSITED THIN FILMS;
CDS;
CLOSE SPACED SUBLIMATION;
CU-DOPING;
ELECTRICAL ANALYSIS;
ENERGY DISPERSIVE X-RAY;
HALL MEASUREMENTS;
IMMERSION TIME;
SCANNING ELECTRON MICROSCOPE;
SOURCE TEMPERATURE;
SULFIDE THIN FILMS;
UV-VIS-NIR SPECTROPHOTOMETERS;
CADMIUM;
CADMIUM COMPOUNDS;
CADMIUM SULFIDE;
CARRIER CONCENTRATION;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR DOPING;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
COPPER;
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EID: 80555149307
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2011.09.060 Document Type: Article |
Times cited : (51)
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References (18)
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