Comparative study of electrical properties of Cd and Te-enriched CdTe thin films at cryogenic temperature

Journal of Alloys and Compounds

Volumn 506, Issue 2, 2010, Pages 661-665

  Shah, Nazar Abbas ^a  

^a COMSATS Institute of Information Technology ^*  (Pakistan)

Author keywords

Cadmium telluride; Coatings; Resistivity; Thin films

Indexed keywords

CDTE; CLOSE SPACED SUBLIMATION; COMPARATIVE STUDIES; CORNING GLASS; CRYOGENIC TEMPERATURES; DEPOSITED FILMS; DEPOSITION TECHNIQUE; ELECTRICAL PROPERTY; ELECTRICAL RESISTIVITY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; OPTICAL TRANSMITTANCE; ORDERS OF MAGNITUDE; P-TYPE; POLYCRYSTALLINE FILM; POLYCRYSTALLINE STRUCTURE; POLYCRYSTALLINE THIN FILM; PREFERRED ORIENTATIONS; RESISTIVITY; SCANNING ELECTRON MICROSCOPES; STRUCTURAL INVESTIGATION;

CADMIUM; CADMIUM ALLOYS; CADMIUM COMPOUNDS; COATINGS; CRYOGENICS; ELECTRIC CONDUCTIVITY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

CADMIUM TELLURIDE;

EID: 77956474929     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.07.038     Document Type: Article

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