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Volumn , Issue , 2011, Pages
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DRAM-on-logic stack - Calibrated thermal and mechanical models integrated into PathFinding flow
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Author keywords
3D; Characterization; Design flow
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Indexed keywords
3D;
3D TECHNOLOGY;
DESIGN AND TECHNOLOGY;
DESIGN FLOW;
DESIGN FLOWS;
EXPERIMENTAL DATA;
MEASUREMENT RESULTS;
MECHANICAL CHARACTERIZATIONS;
MECHANICAL MODEL;
PATHFINDING;
SUPPORT SYSTEMS;
DESIGN;
INTEGRATED CIRCUIT MANUFACTURE;
INTEGRATED CIRCUITS;
INTEGRATION;
SYSTEMS ANALYSIS;
THREE DIMENSIONAL;
LOGIC CIRCUITS;
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EID: 80455168169
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CICC.2011.6055357 Document Type: Conference Paper |
Times cited : (15)
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References (8)
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