Phase-shifting Zernike phase contrast microscopy for quantitative phase measurement

Optics Letters

Volumn 36, Issue 21, 2011, Pages 4305-4307

  Gao, Peng ^a,b,c   Yao, Baoli ^a   Harder, Irina ^a   Lindlein, Norbert ^a   Torcal Milla, Francisco Jose ^a  

^a XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

^b MAX PLANCK INSTITUTE FOR THE SCIENCE OF LIGHT   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT NOISE; DISCRETE POINTS; HIGH-LATERAL RESOLUTION; MICROSCOPIC OBJECTS; OBJECT WAVES; PHASE RETARDATION; PHASE STEPS; PHASE-SHIFTING; POINT LIGHT SOURCE; QUANTITATIVE EVALUATION; QUANTITATIVE PHASE MEASUREMENT; ZERNIKE PHASE CONTRAST;

LIGHT SOURCES; SILICA;

PHASE MEASUREMENT;

EID: 80455132224     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.004305     Document Type: Article

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