Variation on zernike′s phase-contrast microscope

Applied Optics

Volumn 39, Issue 13, 2000, Pages 2152-2158

  Liang, Rongguang ^a   Erwin, J Kevin ^a   Mansuripur, Masud ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DIFFRACTIVE OPTICS; PHASE SHIFT; REFRACTIVE INDEX;

INCIDENT BEAMS;

MICROSCOPES;

EID: 0000565618     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002152     Document Type: Article

References (8)

1. F. Zernike, “How I discovered phase contrast, ” Science 121, 345-349 (1995).
2. X. Kong, T. Feng, and G. Jin, “Reflection Zernike phase contrast microscope, ” Appl. Opt. 29, 1408-1409 (1990).
3. A. H. Bennet, Phase Microscope: Principles and Applications (Wiley, New York, 1951).
4. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, UK, 1980).
5. M. Mansuripur, “Zernike’s method of phase contrast, ” Opt. Photon. News 8(11), 40-43 (1997).
6. S. S. C. Chim and G. S. Kino, “Phase measurements using the Mirau correlation microscope, ” Appl. Opt. 30, 2197-2201 (1991).
7. B. S. Lee and T. C. Strand, “Profilometry with a coherence scanning microscope, ” Appl. Opt. 29, 3784-3788 (1990).
8. P. Sandoz, “Wavelet transform as a processing tool in white-light interferometry, ” Opt. Lett. 22, 1065-1067 (1997).