Artifact halo reduction in phase contrast microscopy using apodization

Optical Review

Volumn 7, Issue 2, 2000, Pages 119-122

  Otaki, Tatsuro ^a  

^a NIKON CORPORATION   (Japan)

Author keywords

Angle of diffraction; Apodization; Apodized phase plate; Halo; Phase contrast microscopy; Phase difference

Indexed keywords

EID: 0034336456     PISSN: 13406000     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10043-000-0119-5     Document Type: Article

References (8)

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3. F. A. Jenkins and H. E. White: Fundamentals of Optics (McGraw-Hill, New York, 1981) 4th ed., p. 602.
4. K. Yamamoto and A. Taira: J. Microscopy 129 (1983) 49.
5. Y. Hiramoto, S. Shimoda and Y. Shoji: Develop., Growth and Differ. 21 (1979) 141.
6. T. Asakura: OYO BUTURI 31 (1962) 730 (in Japanese).
7. T. Asakura: OYO BUTURI 32 (1963) 180 (in Japanese).
8. J. W. Goodman: Introduction to Fourier Optics (McGraw-Hill, New York, 1996) 2nd ed., p. 151.