SCOPUS 정보 검색 플랫폼

Displays

Volumn 32, Issue 5, 2011, Pages 325-329

Nondestructive defect inspection for LCDs using optical coherence tomography

(3) Kim, Su Hwan a Kim, Jee Hyun b Kang, Shin Won b

a Kyungpook National University (South Korea)

b College of IT Engineering (South Korea)

Author keywords

Defect inspection; Nondestructive inspection; Optical coherence tomography; TFT LCD

Indexed keywords

DEFECT INSPECTION; FLAT PANEL; LCD PANELS; NON DESTRUCTIVE; NON DESTRUCTIVE INSPECTION; TFT-LCDS; THREE DIMENSIONAL IMAGES; THREE-DIMENSIONAL SHAPE; TWO-DIMENSIONAL IMAGES;

DEFECTS; FLEXIBLE DISPLAYS; INSPECTION; THIN FILM TRANSISTORS; THREE DIMENSIONAL; TOMOGRAPHY;

LIQUID CRYSTAL DISPLAYS;

EID: 80255123856 PISSN: 01419382 EISSN: None Source Type: Journal
DOI: 10.1016/j.displa.2011.04.002 Document Type: Article

Times cited : (57)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.