Area-mura detection in TFT-LCD panel

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5300, Issue , 2004, Pages 151-158

  Choi, Kyu N ^a   Lee, Jae Y ^a   Yoo, Suk I ^a  

^a Seoul National University   (South Korea)

Author keywords

Mura; Regression Diagnostics; Segmentation; SEMU Index; TFT LCD

Indexed keywords

COMPUTATIONAL COMPLEXITY; LIQUID CRYSTAL DISPLAYS; POLYNOMIAL APPROXIMATION; REGRESSION ANALYSIS; SENSORY PERCEPTION;

REGRESSION DIAGNOSTICS; SEMU-INDEX; TFT-LCD;

IMAGE SEGMENTATION;

EID: 8844232620     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.525557     Document Type: Conference Paper

References (4)

1. W. K. Pratt, S. S. Sawkar and Kevin O'Reilly, "Automatic blemish detection in liquid crystal flat panel displays", IS&T/SPIE symposium on Electronic Imaging : Science and Technology, 3306, San Jose, California, January 2530, 1998.
2. N. Otsu, "A Threshold Selection Method from Gray-Level Histograms", IEEE Transactions on Systems, Man, and Cybernetics, vol. 9, no. 1, pp. 62-66, 1979.
3. P. J. Rousseeuw, Robust Regression and Outlier Detection, John Wiley & Sons, New York, 1987.
4. nd ed., Prentice Hall, 2002.