Evaluation of TFT-LCD defects based on human visual perception

Displays

Volumn 30, Issue 1, 2009, Pages 1-16

  Park, No Kap ^a   Yoo, Suk In ^a  

^a Seoul National University   (South Korea)

Author keywords

Detection; Evaluation; Feature extraction; JND; TFT LCD defect

Indexed keywords

FEATURE EXTRACTION; IMAGE PROCESSING; LIQUID CRYSTAL DISPLAYS; REGRESSION ANALYSIS; VISION;

BASIC IDEAS; DETECTION; DETECTION METHODS; EVALUATION; EVALUATION METHODS; HUMAN EYES; HUMAN PERCEPTIONS; HUMAN VISUAL PERCEPTIONS; IMAGE PROCESSING TECHNIQUES; JND; LOW CONTRASTS; TFT-LCD DEFECT; YIELD LOSSES;

DEFECTS;

EID: 57749120677     PISSN: 01419382     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.displa.2008.03.006     Document Type: Article

References (16)

1. W.K. Pratt, S. Sawkar, K. O'Reilly, Automatic blemish detection in liquid crystal flat panel displays, Proc. SPIE Machine Vision Applications in Industrial Inspection VI 3306, 1998, 2-13.
2. K. N. Choi, J. Y. Lee and S. I. Yoo, "Area-Mura Detection in TFT-LCD Panel, Proc. of SPIE, Vision Geometry XII 5300, 2004, pp. 151-158.
3. S. Baek, W. Kim, T. Koo, I. Choi, K. Park Inspection of defect on LCD panel using polynomial approximation, TENCON 2004. IEEE Region 10 Conference A, 2004, pp. 235-238.
4. J. Ryu, J. Oh, J. Kim, T. Koo, K. Park TFT-LCD panel Blob-Mura inspection using the correlation of wavelet coefficients, TENCON 2004. IEEE Region 10 Conference A, 2004, pp. 219-222.
5. M. Yumi, T. Kohsei, T. Satoshi, Quantitative evaluation of visual performance of liquid crystal displays, Proc. SPIE, Algorithms and Systems for Optical Information Processing IV 4113, 2000, pp. 242-249.
6. SEMI standard, SEMU Index for luminance mura in FPD image quality inspection. SEMI D31-11-2. Available from: .
7. Lee J.Y., and Yoo S.I. Automatic Detection of Region-Mura Defect in TFT-LCD. IEICE Trans on Information and Systems E87-D 10 (2004) 2371-2378
8. Rousseeuw P., and Leroy A. Robust Regression and Outlier Detection (1987), John Wiley & Sons, New York
9. Belsley D., Kuh E., and Welsch R. Regression Diagnostics (1980), John Wiley & Sons, USA
10. Seber G.A.F., and Wild C.J. Nonlinear Regression (1989), Wiley
11. Levenberg K. A method for the solution of certain problems in least squares. Quart. Appl. Math. 2 (1944) 164-168
12. Marquardt D. An algorithm for least squares estimation of nonlinear parameters. SIAM J. Appl. Math 11 (1963) 431-441
13. K.N. Choi, N.K. Park, S.I. Yoo, Image restoration for quantifying TFT-LCD defect levels, to appear at IEICE Trans. on Information Systems, 2007.
14. Kandel E., Schwartz J., and Jessell T. Principles of Neural Science. fourth ed. (2000), McGraw-Hill, New York
15. Heucke L., Knaak M., and Orglmester R. A new Image segmentation method based on human brightness perception and foveal adaptation. IEEE Signal Proc. Lett. 7 6 (2000) 129-131
16. Belkacem-Boussaid K., Beghdadi A., and Depoisot H. Edge detection using Holladay's principle. IEEE Int. Conf. Image Process. 1 (1996) 833-836