Vacuum ultraviolet single-photon ionization time-of-flight mass spectrometer

Fenxi Huaxue/ Chinese Journal of Analytical Chemistry

Volumn 39, Issue 10, 2011, Pages 1470-1475

  Tan, Guo Bin ^a   Gao, Wei ^a   Huang, Zheng Xu ^a   Hong, Yi ^a   Fu, Zhong ^a,b   Dong, Jun Guo ^a   Cheng, Ping ^a   Zhou, Zhen ^a  

^a SHANGHAI UNIVERSITY   (China)

^b Hexin Analytical Instrument Co Ltd   (China)

Author keywords

Online analysis; Soft ionization; Time of flight mass spectrometer; Vacuum ultraviolet single photon ionization; Volatile organic compounds

Indexed keywords

EID: 80155207291     PISSN: 2533820     EISSN: 18722040     Source Type: Journal    
DOI: 10.1016/S1872-2040(10)60473-2     Document Type: Article

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