Atomic-scale visualization of initial growth of homoepitaxial SrTiO 3 thin film on an atomically ordered substrate

ACS Nano

Volumn 5, Issue 10, 2011, Pages 7967-7971

  Shimizu, Ryota ^a,b   Iwaya, Katsuya ^a   Ohsawa, Takeo ^a   Shiraki, Susumu ^a   Hasegawa, Tetsuya ^b   Hashizume, Tomihiro ^a,c,d   Hitosugi, Taro ^a,e  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c HITACHI LTD   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^e JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

interfacial engineering; oxide electronics; pulsed laser deposition; scanning tunneling microscopy; strontium titanate

Indexed keywords

ATOMIC SCALE; ATOMIC-SCALE VISUALIZATION; FILM SURFACES; FILM/SUBSTRATE INTERFACE; HOMOEPITAXIAL; HOMOEPITAXIAL GROWTH; INTERFACIAL ENGINEERING; OXIDE ELECTRONICS; OXIDE GROWTH; SRTIO; SUBSTRATE SURFACE;

ATOMS; EPITAXIAL FILMS; EPITAXIAL GROWTH; OXIDE FILMS; PULSED LASER DEPOSITION; SCANNING TUNNELING MICROSCOPY; STRONTIUM; STRONTIUM ALLOYS; STRONTIUM TITANATES; SURFACE STRUCTURE; VISUALIZATION;

SUBSTRATES;

EID: 80055018463     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn202477n     Document Type: Article

References (30)

1. Imada, M.; Fujimori, A.; Tokura, Y. Metal-Insulator Transitions Rev. Mod. Phys. 1998, 70, 1039-1263
2. Tokura, Y.; Nagaosa, N. Orbital Physics in Transition-Metal Oxides Science 2000, 288, 462-468 (Pubitemid 30236021)
3. 3 Heterointerface Nature 2004, 427, 423-426 (Pubitemid 38168490)
4. Schlom, D. G.; Chen, L.-Q.; Pan, X.; Schmehl, A.; Zurbuchen, M. A. A Thin Film Approach to Engineering Functionality into Oxides J. Am. Ceram. Soc. 2008, 91, 2429-2454
5. y Epitaxial Thin Films J. Appl. Phys. 1994, 75, 5227-5232
6. 2 Thin Films Science 1995, 267, 71-73
7. Ma, J. X.; Gillaspie, D. T.; Plummer, E. W.; Shen, J. Visualization of Localized Holes in Manganite Thin Films with Atomic Resolution Phys. Rev. Lett. 2005, 95, 237210
8. 3(001) Surface by an Oxygen Overlayer Phys. Rev. Lett. 2009, 102, 066104
9. 3(001) Thin Films Grown in Step-Flow Mode by Pulsed Laser Deposition Appl. Phys. Express 2010, 3, 075701
10. 3 Thin Films J. Appl. Phys. 2010, 108, 073710
11. 3(001) by Control of Surface Reconstructions Appl. Phys. Lett. 2011, 98, 161908
12. 3(001), the (√13×√13) R 33.7° Surface, and Related Structures Phys. Rev. Lett. 2011, 106, 176102
13. 3 Crystal Surface Science 1994, 266, 1540-1542
14. 3(001) Surface Reconstructions. Manuscript in preparation.
15. 3 Surface Structure Physica C 1994, 229, 1-11
16. 3(001) Surface Appl. Phys. Lett. 2010, 96, 231901
17. 2: A Combined High-Resolution STM and DFT Study Surf. Sci. 2005, 598, 226-245 (Pubitemid 41706170)
18. 3(001) Surface Surf. Sci. 2002, 505, 1-13 (Pubitemid 34449223)
19. 3(100) Surf. Sci. 2003, 542, 177-191
20. Fu, Q.; Wagner, T. Interaction of Nanostructured Metal Overlayers with Oxide Surfaces Surf. Sci. Rep. 2007, 62, 431-498 (Pubitemid 47615194)
21. Ohnishi, T.; Lippmaa, M.; Yamamoto, T.; Meguro, S.; Koinuma, H. Improved Stoichiometry and Misfit Control in Perovskite Thin Film Formation at a Critical Fluence by Pulsed Laser Deposition Appl. Phys. Lett. 2005, 87, 241919
22. Chrisey, D. B.; Hubler, G. K., Eds. Pulsed Laser Deposition of Thin Films, 1 st ed.; Wiley-Interscience: New York, 1994.
23. Willmott, P. R. Deposition of Complex Multielemental Thin Films Prog. Surf. Sci. 2004, 76, 163-217
24. Lucatorto, T.; Graef, M. D., Eds. Experimental Methods in the Physical Sciences; Laser Ablation and Desorption; Academic Press: Waltham, MA, 1998; Vol. 30.
25. Kolasinski, K. W. Surface Science: Foundations of Catalysis and Nanoscience, 2 nd ed.; Wiley: New York, 2008.
26. Xue, Q.-K.; Hashizume, T.; Sakurai, T. Scanning Tunneling Microscopy of III-V Compound Semiconductor (001) Surfaces Prog. Surf. Sci. 1997, 56, 1-132
27. 3(001) Phys. Rev. Lett. 2005, 94, 046103
28. 3(001) Chem. Commun. 2007, 2941-2943 (Pubitemid 47052133)
29. 3 Template Nanotechnology 2007, 18, 075301
30. Iwaya, K.; Shimizu, R.; Hashizume, T.; Hitosugi, T. Systematic Analyses of Vibration Noise of a Vibration Isolation System for High-Resolution Scanning Tunneling Microscopes Rev. Sci. Instrum. 2011, 82, 083702