Analysis of adsorption and binding behaviors of silver nanoparticles onto a pyridyl-terminated surface using XPS and AFM

Langmuir

Volumn 27, Issue 21, 2011, Pages 12916-12922

  Fukuda, Nobuko ^a   Ishida, Naoyuki ^a   Nomura, Kenichi ^a   Wang, Tong ^a   Tamada, Kaoru ^b,c   Ushijima, Hirobumi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; BINDING BEHAVIORS; BINDING STATE; CARBOXYL GROUPS; DRIVING FORCES; PYRIDINIUM; PYRIDYL; PYRIDYL GROUPS; SILICON WAFER SURFACE; SILVER NANOPARTICLES;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CITRIC ACID; HYDROGEN; HYDROGEN BONDS; NANOPARTICLES; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SILVER; VAN DER WAALS FORCES; X RAY PHOTOELECTRON SPECTROSCOPY;

ADSORPTION;

EID: 80054926926     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la2032785     Document Type: Article

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