Beyond the lateral resolution limit by phase imaging

Journal of Biomedical Optics

Volumn 16, Issue 10, 2011, Pages

  Cotte, Yann ^a   Toy, M Fatih ^a   Depeursinge, Christian ^a  

^a EPFL   (Switzerland)

Author keywords

digital holography; microscopy; phase imaging; phase vortices; point spread function; super resolution

Indexed keywords

ANGULAR SCANNING; AXIAL DISTANCE; BAND PASS; DIGITAL HOLOGRAPHIC MICROSCOPY; DIGITAL HOLOGRAPHY; HIGH NUMERICAL APERTURES; ILLUMINATION BEAMS; INFORMATION CONTENTS; LATERAL RESOLUTION; NANOMETRIC HOLES; PHASE IMAGING; PHASE IMAGING SYSTEMS; PHASE VORTICES; POINT SOURCES; RESOLUTION LIMITS; SIGNAL TO NOISE; SPATIAL RESOLUTION; SUB-WAVELENGTH; SUPER-RESOLUTION; TWO-POINT RESOLUTION;

COMPUTER GENERATED HOLOGRAPHY; OPTICAL TRANSFER FUNCTION; SIGNAL TO NOISE RATIO;

OPTICAL VARIABLES MEASUREMENT;

NANOMATERIAL;

ARTICLE; HOLOGRAPHY; LIGHT RELATED PHENOMENA; METHODOLOGY; PHASE CONTRAST MICROSCOPY; RADIATION SCATTERING; SCANNING ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; STATISTICS; THEORETICAL MODEL; ULTRASTRUCTURE;

HOLOGRAPHY; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, INTERFERENCE; MICROSCOPY, PHASE-CONTRAST; MODELS, THEORETICAL; NANOSTRUCTURES; OPTICAL PHENOMENA; SCATTERING, RADIATION; SIGNAL-TO-NOISE RATIO;

EID: 80054847930     PISSN: 10833668     EISSN: 15602281     Source Type: Journal    
DOI: 10.1117/1.3640812     Document Type: Article

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