Superresolution digital holographic microscopy for three-dimensional samples

Optics Express

Volumn 16, Issue 23, 2008, Pages 19260-19270

  Micó, Vicente ^a   Zalevsky, Zeev ^b   Ferreira, Carlos ^a   García, Javier ^a  

^a UNIVERSITY OF VALENCIA   (Spain)

^b BAR ILAN UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CUTOFF FREQUENCY; DIFFRACTION; HOLOGRAPHY; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PHASE MEASUREMENT; SYNTHETIC APERTURES;

DIFFRACTION LIMITS; DIGITAL HOLOGRAPHIC MICROSCOPY; INTERFEROMETRIC ARCHITECTURE; NUMERICAL RECONSTRUCTION; SUPER RESOLUTION; SUPER RESOLUTION IMAGING; THREEDIMENSIONAL (3-D); TIME MULTIPLEXING;

HOLOGRAMS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING; THREE DIMENSIONAL IMAGING;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGING, THREE-DIMENSIONAL; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 56149127623     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.019260     Document Type: Article

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