Study on the structural and optical properties of Cd1-xZnxO layers enhanced by rapid thermal annealing

Electronic Materials Letters

Volumn 7, Issue 3, 2011, Pages 215-220

  Yu, J H ^a   Kim, J H ^a   Jeong, T S ^a   Akhtar, M Shaheer ^a   Youn, C J ^a   Hong, K J ^b  

^a Chonbuk National University   (South Korea)

^b Chosun University   (South Korea)

Author keywords

bandgap; CdZnO; characterization; RF magnetron sputtering; RTA

Indexed keywords

ALLOY LAYERS; BAND GAP ENERGY; CDZNO; COMPOSITION RATIO; CRYSTALLINITIES; CUBIC STRUCTURE; IN-PHASE; MIXED PHASIS; PHASE SEGREGATIONS; POLYCRYSTALLINE; RADIO-FREQUENCY MAGNETRON CO-SPUTTERING; RELIABLE FORMATIONS; RF-MAGNETRON SPUTTERING; STRUCTURAL AND OPTICAL PROPERTIES; THERMAL-ANNEALING; X-RAY DIFFRACTION MEASUREMENTS; ZNO;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; ENERGY GAP; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; PHASE SEPARATION; RAPID THERMAL ANNEALING; X RAY DIFFRACTION; ZINC OXIDE;

ZINC;

EID: 80054110044     PISSN: 17388090     EISSN: 20936788     Source Type: Journal    
DOI: 10.1007/s13391-011-0907-z     Document Type: Article

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