Hydrophobic switching nature of methylcellulose ultra-thin films: Thickness and annealing effects

Journal of Physics Condensed Matter

Volumn 23, Issue 43, 2011, Pages

  Innis Samson, Vallerie Ann ^a   Sakurai, Kenji ^a,b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ANNEALING EFFECTS; ANNEALING PROCESS; BULK GLASS; BULK SOLUTIONS; FILM TEXTURES; HIGHLY-CORRELATED; HYDROPHOBIC SWITCHES; LOWER CRITICAL SOLUTION TEMPERATURE; METHYLCELLULOSE; RADIUS OF GYRATION; SENSING APPLICATIONS; SESSILE DROPS; SI SUBSTRATES; SWITCHING PROPERTIES; THERMAL RESPONSE; THERMAL-ANNEALING; THERMO-SENSITIVE PROPERTIES; THERMORESPONSIVE POLYMER; THIN-FILM STRUCTURE; X RAY REFLECTIVITY;

ANGLE MEASUREMENT; ANNEALING; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; CRYSTAL ATOMIC STRUCTURE; DROPS; FILM THICKNESS; GLASS TRANSITION; HYDROPHOBICITY; PHASE SEPARATION; POLYMER FILMS; SEMICONDUCTING SILICON COMPOUNDS; SURFACE PROPERTIES; SURFACE TOPOGRAPHY; THICK FILMS; ULTRATHIN FILMS;

TOPOGRAPHY;

GLASS; METHYLCELLULOSE; POLYMER; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL PHENOMENA; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; PHYSICS; SURFACE PROPERTY; TEMPERATURE; X RAY;

GLASS; HYDROPHOBIC AND HYDROPHILIC INTERACTIONS; MATERIALS TESTING; METHYLCELLULOSE; MICROSCOPY, ATOMIC FORCE; PHYSICS; POLYMERS; SILICON; SURFACE PROPERTIES; TEMPERATURE; X-RAYS;

EID: 80054096077     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/23/43/435010     Document Type: Article

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