Growth studies and characterization of In2S3 films prepared by hydrothermal method and their conversion to In2O 3 films

Materials Chemistry and Physics

Volumn 130, Issue 3, 2011, Pages 932-936

  Zhang, Lina ^a   Zhang, Wei ^a   Yang, Haibin ^a   Fu, Wuyou ^a   Zhao, Wenyan ^a   Zhao, Hui ^a   Ma, Jinwen ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

Annealing; Nucleation; Semiconductors; Thin films

Indexed keywords

ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FLUORINE DOPED TIN OXIDE; GROWTH MECHANISMS; HYDROTHERMAL METHODS; MOLAR RATIO; PHOTOELECTROCHEMICAL PROPERTIES; PRECURSOR FILMS; REACTION TEMPERATURE;

ENERGY DISPERSIVE SPECTROSCOPY; FIELD EMISSION MICROSCOPES; FLUORINE; MORPHOLOGY; NANOCOMPOSITES; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TIN; TIN OXIDES; X RAY DIFFRACTION;

INDIUM;

EID: 80054044254     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2011.08.014     Document Type: Article

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