Why is it so hard to build and validate discrete event simulation models of manufacturing facilities?

International Series in Operations Research and Management Science

Volumn 152, Issue , 2011, Pages 271-288

  Fischbein, Seth A ^a   Yellig, Edward ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80054028347     PISSN: 08848289     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-1-4419-8191-2_12     Document Type: Chapter

References (10)

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4. Pillai D, Bass E, Dempsey J, Yellig E (2003) “300mm full factory dynamic simulations for 90nm and 65nm IC manufacturing”. IEEE International Symposium of Semiconductor Manufacturing conference (ISSM), San Jose, CA
5. Pillai D (2002) “Operations management challenges for 300mm production”. Modeling and Analysis of Semiconductor Manufacturing (MASM), Phoenix, AZ
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7. Schruben L (1986) “Simulation optimization using frequency domain methods.” Proceedings of the 1986 Winter simulation conference 366–369
8. Sohn B, Pillai D, Acker N (2000) “300mm factory design for operational effectiveness”. IEEE/ASMC Conference, SEMICON Europa. Munich, Germany
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10. Yellig E, Fox D, Tag P (2002) “Maximizing value of factory automation: 300mm fab capacity.” Proceedings of the IEEE international symposium on semiconductor manufacturing – ISSM 271–274