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Volumn 33, Issue 3, 2001, Pages 229-244

A frequency domain metamodeling approach to transient sensitivity analysis

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FREQUENCY DOMAIN ANALYSIS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; RANDOM PROCESSES;

EID: 0035276142     PISSN: 0740817X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1007607717169     Document Type: Article
Times cited : (5)

References (33)
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  • 14
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    • Hazra, M.1    Park, S.K.2
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  • 23
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    • Welch, P.D. (1983) The statistical analysis of simulation results, in Computer Performance Modeling Handbook, Lavenberg, S.S. (ed), Academic Press, New York, pp. 267-329. Douglas J. Morrice is an Associate Professor in the MSIS Department at The University of Texas at Austin. He received his undergraduate degree in Operations Research at Carleton University in Ottawa, Canada. He holds an M.S. and a Ph.D. in Operations Research and Industrial Engineering from Cornell University. His research interests include operations modeling and the statistical design and analysis of large scale simulation experiments. Dr. Morrice is a member INFORMS. He served as the Secretary for the INFORMS College on Simulation (1994-1996) and was Co-Editor of the Proceedings of the 1996 Winter Simulation Conference. Lee W. Schruben is a Professor in the Department of Industrial Engineering and Operations Research at the University of California, Berkeley. He holds a B.S. degree in Engineering from Cornell, a M.S. degree in Statistics from the University of North Carolina, and a Ph.D. in Administrative Sciences from Yale. His research is on discrete event simulation modeling and analysis methodologies in a variety of applications including manufacturing, agriculture, health care, banking, and broadcasting. Prior to joining the Berkeley faculty in 1999, Professor Schruben was in the School of Operaions Research and Industrial Engineering at Cornell University where he was the Andrew S. Schultz Jr. Professor of Industrial Engineering. He has been the Distinguished Visiting Professor at SEMATCH and the Principal Investigator for Cornell's Center for Semiconductor Manufacturing Research.
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    • Welch, P.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.