A study of the optical properties and adhesion of zinc sulfide anti-reflection thin film coated on a germanium substrate

Applied Surface Science

Volumn 258, Issue 2, 2011, Pages 818-821

  Firoozifar, S A R ^a   Behjat, A ^a   Kadivar, E ^b   Ghorashi, S M B ^a   Zarandi, M Borhani ^a  

^a YAZD UNIVERSITY   (Iran)

^b PERSIAN GULF UNIVERSITY   (Iran)

Author keywords

Adhesion; Annealing; Antireflection; Ge; Optical properties; ZnS

Indexed keywords

ADHESION; ANNEALING; DEPOSITION RATES; EVAPORATION; GERMANIUM; II-VI SEMICONDUCTORS; OPTICAL PROPERTIES; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC; ZINC SULFIDE;

ANNEALING TEMPERATURES; ANTI-REFLECTION; EVAPORATION METHOD; EVAPORATION RATE; FAR INFRARED REGIONS; GERMANIUM SUBSTRATES; TRANSMISSION INTENSITY; ZINC SULFIDE (ZNS);

SULFUR COMPOUNDS;

EID: 80054023012     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.08.105     Document Type: Article

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