Effect of ambient hydrogen sulfide on the physical properties of vacuum evaporated thin films of zinc sulfide

Applied Surface Science

Volumn 254, Issue 8, 2008, Pages 2233-2237

  Singh, Beer Pal ^a   Singh, Virendra ^b   Tyagi, R C ^a   Sharma, T P ^a  

^a CH CHARAN SINGH UNIVERSITY   (India)

^b Forensic Science Laboratory   (India)

Author keywords

Evaporation; Hydrogen sulfide; Optical properties; Structural properties; Zinc sulfide

Indexed keywords

EVAPORATION; HYDROGEN SULFIDE; PYROLYSIS; THIN FILMS; VACUUM; X RAY DIFFRACTION;

DEPOSITED FILMS; SUBSTRATES TEMPERATURE; VACUUM CHAMBER;

ZINC SULFIDE;

EID: 38749102031     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.08.090     Document Type: Article

References (23)

1. Neumark G.F., Park R.M., and Depuydt J.M. Phys. Today (1994) 26
2. McClean I.P., and Thomas C.B. Semicond. Sci. Technol. 7 (1992) 1394
3. Katayama H., Oda S., and Kukimoto H. Appl. Phys. Lett. 27 (1975) 657
4. Much G.O.R. Phys. Status Solid A 69 (1982) 11
5. Ledger A.M. Appl. Opt. 18 (1979) 2979
6. Jones P.L., Moore D.M., and Smith D.C. J. Phys. E (1976) 312
7. Meng X.-M., Jiang Y., Liu J., Lee C.-S., Bello I., and Lee S.-T. Appl. Phys. Lett. 83 11 (2003) 2244-2246
8. Li Q., and Wang C. Appl. Phys. Lett. 83 2 (2003) 359-361
9. Huang H.-F. Vacuum 55 2 (1999) 127-131
10. Shao L.-X., Chang K.-H., and Hwang H.-L. Appl. Surf. Sci. 212 (2003) 305
11. Xian H., Benalloul P., Barthou C., and Benoit J. Thin Solid Films 248 (1994) 193
12. Mandal S.K., Chaudhuri S., and Pal A.K. Thin Solid Films 350 (1999) 209
13. Nitta A., Tanaka K., Maekawa Y., Kusabiraki M., and Aozasa M. Thin Solid Films 384 (2001) 261
14. Yokoyama M., Kashiro K., and Ohta S. J. Cryst. Growth 81 (1987) 73
15. Oikkonen M., Blomberg M., Tuomi T., and Tammenmaa M. Thin Solid Films 124 (1985) 317
16. Yoshikawa A., Yamaga S., Tanaka K., and Kasai H. J. Cryst. Growth 72 (1985) 13
17. Tang W., and Cameron D.C. Thin Solid Films 280 (1996) 221
18. Oladeji I.O., and Chow L. Thin Solid Films 339 (1999) 148
19. Tyagi R.C., and Kumar R. Thin Solid Films 25 (1975) S21-S24
20. Ihanus J., Ritala M., Leskelä M., and Rauhala E. Appl. Surf. Sci. 112 (1997) 154
21. In: McClune W.F. (Ed). JCPDS Powder Diffraction File (1990), International Center for Diffraction Data, Swarthmore, PA
22. Singh V., Singh B.P., Sharma T.P., and Tyagi R.C. Eleventh International Workshop on the Physics of Semiconductor Devices, vol. 2. SSPL, Delhi (2001) p. 1340
23. Manifacier J.C., Gasiot J., and Fillard J.P. J. Phys. E 9 (1976) 1002