Epitaxial Pb(Zr,Ti)O 3 thin films on flexible substrates

Journal of the American Ceramic Society

Volumn 94, Issue 10, 2011, Pages 3223-3226

  Shelton, Christopher T ^a   Gibbons, Brady J ^a  

^a Oregon State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAXIALLY TEXTURED TEMPLATE; CHEMICAL SOLUTION DEPOSITION; CRYSTALLOGRAPHIC TEXTURES; DOMAIN STRUCTURE; EPITAXIAL THIN FILMS; FERROELECTRIC MEASUREMENTS; FLEXIBLE SUBSTRATE; HIGH TEMPERATURE SUPERCONDUCTING; HYSTERESIS BEHAVIOR; HYSTERESIS MEASUREMENTS; IN-PLANE ORIENTATION; LATTICE MATCHING; ORIENTATION DEPENDENCE; PB(ZR , TI)O; PIEZOELECTRIC BEHAVIOR; PIEZOELECTRIC PROPERTY; PIEZORESPONSE FORCE MICROSCOPY; PZT THIN FILM; REMNANT POLARIZATIONS; SINGLE CRYSTAL SUBSTRATES; SINGLE CRYSTAL THIN FILMS; SINGLE CRYSTALLINE SUBSTRATES; SMOOTH SURFACE;

DEPOSITION; ELECTRIC WIRE; EPITAXIAL GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; HYSTERESIS; IMAGE MATCHING; ION BEAM ASSISTED DEPOSITION; LEAD; MANGANESE OXIDE; PIEZOELECTRICITY; SINGLE CRYSTALS; SUBSTRATES; VAPOR DEPOSITION; ZIRCONIUM;

EPITAXIAL FILMS;

EID: 80053980849     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2011.04811.x     Document Type: Article

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