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Volumn 107, Issue 16, 2011, Pages

Electronic structure investigation of highly compressed aluminum with K edge absorption spectroscopy

(12) Benuzzi Mounaix, A a Dorchies, F b Recoules, V c Festa, F a,c Peyrusse, O b Levy, A a Ravasio, A a Hall, T d Koenig, M a Amadou, N a Brambrink, E a Mazevet, S c,e

a ECOLE POLYTECHNIQUE (France)

b UNIVERSITÉ DE BORDEAUX (France)

c DIF (France)

d UNIVERSITY OF ESSEX (United Kingdom)

e UNIVERSITÉ PARIS DIDEROT (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRONIC STRUCTURE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

DENSE PLASMA; EXTREME CONDITIONS; SOLID DENSITY; THEORETICAL APPROACH; TIME-RESOLVED; VISIBLE DIAGNOSTICS; X RAY ABSORPTION NEAR EDGE STRUCTURE; X-RAY SOURCES;

ALUMINUM;

EID: 80053954974 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.107.165006 Document Type: Article

Times cited : (60)

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