SCOPUS 정보 검색 플랫폼

Volumn 515, Issue 1-3, 2011, Pages 132-136

Structural characteristics, low threshold ultraviolet lasing and ultrafast carrier dynamics in high crystalline ZnO nanowire arrays

(5) Xing, G Z a,c,d Wang, D D b Yao, B a Lloyd Foong Nien, A Q c Yan, Y S b

a JILIN UNIVERSITY (China)

b JIANGSU UNIVERSITY (China)

c NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

d UNIVERSITY OF PENNSYLVANIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DYNAMICS; GAIN MEDIUM; LONG LIFETIME; LOW THRESHOLDS; NANO-DEVICES; NEAR BAND EDGE; OPTICAL EXCITATIONS; PURE ZNO; RADIATIVE RECOMBINATION; RECOMBINATION EMISSION; ROOM TEMPERATURE; STRUCTURAL CHARACTERISTICS; TEMPERATURE DEPENDENT; TIME-RESOLVED PHOTOLUMINESCENCE SPECTROSCOPY; ULTRAFAST CARRIER DYNAMICS; ULTRAVIOLET LASING; WELL-ALIGNED; ZNO NANOWIRE ARRAYS; ZNO NANOWIRES;

DYNAMICS; OPTICAL PROPERTIES; PHOTOEXCITATION; PHOTOLUMINESCENCE SPECTROSCOPY; ZINC OXIDE;

NANOWIRES;

EID: 80053895784 PISSN: 00092614 EISSN: None Source Type: Journal
DOI: 10.1016/j.cplett.2011.09.007 Document Type: Article

Times cited : (19)

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