Statistical analysis of subnanometer residual disorder in photonic crystal waveguides: Correlation between slow light properties and structural properties

Journal of Vacuum Science and Technology B

Volumn 29, Issue 5, 2011, Pages

  Le Thomas, N ^a   Diao, Z ^a   Zhang, H ^a   Houdre R ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; GUIDED ELECTROMAGNETIC WAVE PROPAGATION; LASER OPTICS; OPTICAL WAVEGUIDES; PHOTONIC CRYSTALS; SCANNING ELECTRON MICROSCOPY; STATISTICS; WAVEGUIDE COMPONENTS;

FOURIER-SPACE IMAGING; MICROSCOPIC ANALYSIS; OPTICAL CHARACTERIZATION; PHOTONIC CRYSTAL WAVEGUIDE; PLANAR PHOTONIC-CRYSTAL WAVEGUIDES; SCANNING ELECTRONIC MICROSCOPES; STATISTICAL PROPERTIES; STRUCTURAL DISORDERS;

SLOW LIGHT;

EID: 80053548641     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.3622289     Document Type: Article

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