Statistical analysis of geometrical imperfections from the images of 2D photonic crystals

Optics Express

Volumn 13, Issue 7, 2005, Pages 2487-2502

  Skorobogatiy, Maksim ^a   Bégin, Guillaume ^a   Talneau, Anne ^b  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON BEAM LITHOGRAPHY; IMAGE ANALYSIS; INTEGRATED OPTICS; MICROSTRUCTURE; OPTICAL SYSTEMS; PERMITTIVITY; PHOTONS; STACKING FAULTS; STATISTICAL METHODS; SURFACE ROUGHNESS; TWO DIMENSIONAL;

DISORDER PARAMETERS; PHOTONIC CRYSTALS (PC); RADIATION LOSS; RANDOM DISPLACEMENT;

CRYSTALLINE MATERIALS;

EID: 21244490470     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.002487     Document Type: Article

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