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Volumn 80, Issue 12, 2009, Pages

Light transport regimes in slow light photonic crystal waveguides

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EID: 70350712346     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.125332     Document Type: Article
Times cited : (68)

References (52)
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    • The scattering process that is associated with this spatially inhomogeneous emission occurs mainly at the nonideal row of holes bordering the line defect.
    • The scattering process that is associated with this spatially inhomogeneous emission occurs mainly at the nonideal row of holes bordering the line defect.
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    • The images in Fig. 3 are typical illustrations of light transport independent of the material used (silicon or indium phosphide waveguide) or technology (e-beam lithography or deep UV lithography), as we know from our several previous experiments.
    • The images in Fig. 3 are typical illustrations of light transport independent of the material used (silicon or indium phosphide waveguide) or technology (e-beam lithography or deep UV lithography), as we know from our several previous experiments.
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    • In the angular spectrum C, the small line at positive k is not related to the back reflection as confirmed by its slope on the 2D map of the angular spectrum.
    • In the angular spectrum C, the small line at positive k is not related to the back reflection as confirmed by its slope on the 2D map of the angular spectrum.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.