Characterization of lattice defects by x-ray absorption spectroscopy at the Zn K-edge in ferromagnetic, pure ZnO films

Journal of Applied Physics

Volumn 110, Issue 6, 2011, Pages

  Haug, J ^a   Chasse A ^a   Dubiel, M ^a   Eisenschmidt, Ch ^a   Khalid, M ^b   Esquinazi, P ^b  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE FILMS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FIRST-PRINCIPLES CALCULATION; GRAIN BOUNDARY EFFECTS; LATTICE SPACING; NITROGEN PARTIAL PRESSURES; NITROGEN PRESSURE; PURE ZNO; SINGLE-CRYSTALLINE; UNIT CELLS; VACANCY CONCENTRATION; VACANCY DEFECTS; WURTZITE STRUCTURE; WURTZITES; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; X-RAY POLARIZATIONS; XANES SPECTRA; XRD; ZNO; ZNO FILMS; ZNO SINGLE CRYSTALS;

CALCULATIONS; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; DEFECTS; DIFFRACTIVE OPTICS; ELECTROMAGNETIC WAVE ABSORPTION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; FERROMAGNETIC MATERIALS; FERROMAGNETISM; GRAIN BOUNDARIES; METALLIC FILMS; NITROGEN; VACANCIES; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE; ZINC SULFIDE;

SINGLE CRYSTALS;

EID: 80053534168     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3631774     Document Type: Article

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