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Volumn , Issue , 2011, Pages
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Lifetime investigation of high power IGBT modules
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Author keywords
3D CT scan; Coffin manson; IGBT lifetime; IGBT power cycling; VCE measurement
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Indexed keywords
APPLICATION SPECIFIC;
COFFIN-MANSON;
CT SCAN;
FAILURE MECHANISM;
HIGH-POWER;
MEASURING SYSTEMS;
POWER MODULE;
TEST BENCHES;
VOLTAGE DROP;
WORKING POINT;
ELECTRIC NETWORK ANALYSIS;
POWER ELECTRONICS;
THREE DIMENSIONAL;
COMPUTERIZED TOMOGRAPHY;
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EID: 80053519992
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (82)
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References (8)
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